Quadratic Statistical $MAX$ Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits

Statistically Based Parametric Yield Prediction For Integrated Circuits - Semiconductor Manufacturing, IEEE Transactions on

This paper presents a novel procedure for predicting integrated circuit parametric performance and yield when provided with sample transistor test results and a circuit schematic. Two enhancements to the existing Monte Carlo simulation procedures are described: 1) a multivariate nested model is used to reproduce random process-induced device variations, rather than the multivariate multinormal ...

Statistical σ approximation to max-product operators

Statistical Verification and Optimization of Integrated Circuits

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Novel yield model for integrated circuits with clustered defects

As wafer sizes increase, the clustering phenomenon of defects increases. Clustered defects cause the conventional Poisson yield model underestimate actual wafer yield, as defects are no longer uniformly distributed over a wafer. Although some yield models, such as negative binomial or compound Poisson models, consider the effects of defect clustering on yield prediction, these models have some ...

Quantile approximation for robust statistical estimation

Given a set P of n points in R d , a fundamental problem in computational geometry is concerned with nding the smallest enclosing \range" of P. Well known instances of this problem include nding, e.g., the smallest enclosing box 10], smallest enclosing simplex 11], minimum volume ball 17, 20], (2-D) smallest enclosing ellipsoid 16, 20, 2, 14], and minimum volume annulus 1, 8, 5]. In this paper,...